The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 05, 2025
Filed:
Mar. 17, 2020
Institute of Intelligent Manufacturing, Guangdong Academy of Sciences, Guangdong, CN;
Yisen Liu, Guangdong, CN;
Songbin Zhou, Guangdong, CN;
Chang Li, Guangdong, CN;
Wei Han, Guangdong, CN;
Kejia Huang, Guangdong, CN;
Weixin Liu, Guangdong, CN;
Zefan Qiu, Guangdong, CN;
Abstract
Disclosed is a hyperspectral data analysis method based on a semi-supervised learning strategy, which includes: hyperspectral sample data is acquired; a sample training set and a prediction set are constructed, herein an unlabeled prediction set sample is used; a regression network based on a generative adversarial network is constructed, including a generator network that generates a sample, and a discriminator/regressor network that has functions of judging the authenticity of the sample and outputting a quantitative analysis value at the same time; a loss function of the generative adversarial network is constructed, including a loss function of the discriminator, a loss function of the regressor, and a loss function of the generator with a sample distribution matching function. The generative adversarial network is used to generate a sample. A sample distribution matching strategy is used to supplement an existing unlabeled sample set. So, the accuracy of hyperspectral quantitative analysis is improved.