The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 05, 2025

Filed:

Aug. 28, 2024
Applicant:

Hyundai Mobis Co., Ltd., Seoul, KR;

Inventors:

Moon Yong Jin, Yongin-si, KR;

Jun Ho Choi, Uiwang-si, KR;

Ki Chan Kim, Suwon-si, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 7/14 (2006.01); G06T 7/11 (2017.01); G06V 10/25 (2022.01); G06V 10/75 (2022.01); G06V 10/764 (2022.01);
U.S. Cl.
CPC ...
G06K 7/1443 (2013.01); G06T 7/11 (2017.01); G06V 10/25 (2022.01); G06V 10/751 (2022.01); G06V 10/764 (2022.01);
Abstract

The present disclosure provides a method for recognizing a coded marker including: obtaining a marker image including a coded marker from an input image and normalizing the marker image to obtain a normalized image detecting a region of interest in the normalized image; generating a first binarized image by performing binarization to classify each pixel of the normalized image into one of a foreground and a background; generating a second binarized image by dividing the normalized image into a plurality of partitions, performing binarization for pixel values for each partition to generate a binarized image for the each partition, and combining the binarized images for the each partition; generating an integrated binarized image according to a result of comparing pixel values at the same location in the first binarized image and the second binarized image; and obtaining identification data of the coded marker from the integrated binarized image.


Find Patent Forward Citations

Loading…