The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 05, 2025
Filed:
Nov. 10, 2021
Autodesk, Inc., San Francisco, CA (US);
Peter Meltzer, London, GB;
Amir Hosein Khas Ahmadi, Toronto, CA;
Pradeep Kumar Jayaraman, Toronto, CA;
Joseph George Lambourne, London, GB;
Aditya Sanghi, Toronto, CA;
Hooman Shayani, London, GB;
AUTODESK, INC., San Francisco, CA (US);
Abstract
In various embodiments, a style comparison metric application generates a style comparison metric for pairs of different three dimensional (3D) computer-aided design (CAD) objects. In operation, the style comparison metric application executes a trained neural network any number of times to map 3D CAD objects to feature maps. Based on the feature maps, the style comparison metric application computes style signals. The style comparison metric application determines values for weights based on the style signals. The style comparison metric application generates the style comparison metric based on the weights and a parameterized style comparison metric.