The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 05, 2025

Filed:

Feb. 25, 2022
Applicants:

Namie Suzuki, Shizuoka, JP;

Kousuke Suzuki, Shizuoka, JP;

Tohru Suganuma, Shizuoka, JP;

Masashi Nagayama, Shizuoka, JP;

Minoru Masuda, Shizuoka, JP;

Hiroyuki Kishida, Shizuoka, JP;

Kento Takeuchi, Shizuoka, JP;

Kaede Masuko, Shizuoka, JP;

Inventors:

Namie Suzuki, Shizuoka, JP;

Kousuke Suzuki, Shizuoka, JP;

Tohru Suganuma, Shizuoka, JP;

Masashi Nagayama, Shizuoka, JP;

Minoru Masuda, Shizuoka, JP;

Hiroyuki Kishida, Shizuoka, JP;

Kento Takeuchi, Shizuoka, JP;

Kaede Masuko, Shizuoka, JP;

Assignee:

Ricoh Company, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03G 9/113 (2006.01); G03G 9/08 (2006.01); G03G 15/08 (2006.01);
U.S. Cl.
CPC ...
G03G 9/1139 (2013.01); G03G 9/0823 (2013.01); G03G 9/1133 (2013.01); G03G 9/1136 (2013.01); G03G 15/08 (2013.01);
Abstract

A carrier for forming an electrophotographic image is provided. The carrier comprises a core particle and a coating layer coating the core particle. The coating layer contains a conductive component comprising an element A, and a coating resin comprising an element B. The element A is undetected in the coating resin by an energy dispersive X-ray spectrometer, and the element B is undetected in the conductive component by the energy dispersive X-ray spectrometer. A standard deviation of a value A/B is 0.4 or less, where the value A/B is a ratio of the element A to the element B in intensity measured by the energy dispersive X-ray spectrometer.


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