The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 05, 2025

Filed:

Jun. 09, 2022
Applicant:

Fujifilm Corporation, Tokyo, JP;

Inventor:

Shunsuke Miyagishima, Saitama, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 25/00 (2006.01); G02B 9/34 (2006.01);
U.S. Cl.
CPC ...
G02B 25/001 (2013.01); G02B 9/34 (2013.01);
Abstract

An observation optical system includes a display element and an eyepiece lens arranged on an eyepoint side of the display element. The eyepiece lens consists of a first lens having positive refractive power, a second lens having negative refractive power, and a rear side lens group including two or more lenses consecutively in order from a side closest to the display element to the eyepoint side. In a case where a half value of a longest diameter of a display region in the display element is denoted by H, and a focal length of the eyepiece lens is denoted by f, the observation optical system satisfies a conditional expression represented by 0.3<H/f<0.5.


Find Patent Forward Citations

Miyagishima, Shunsuke. (2025). Observation optical system and optical apparatus (U.S. Patent No. 12379584). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12379584

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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