The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 05, 2025

Filed:

Sep. 26, 2022
Applicant:

Microchip Technology Incorporated, Chandler, AZ (US);

Inventors:

Gary Qu Jin, Kanata, CA;

Chris Du Quesnay, Ottawa, CA;

Ehsan Rahimi, Ottawa, CA;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 29/26 (2006.01);
U.S. Cl.
CPC ...
G01R 29/26 (2013.01);
Abstract

A device for measuring phase noise, including a sampler to sample an input signal, an input filter to receive an input from the sampler, a noise generator to generate a noise signal, a combiner to receive input from, respectively, the input filter and the noise generator, the combiner to output an integrated noise output measurement. The input filter may operate in either the time domain or the frequency domain. The noise generate may generate a noise signal based on the sampler output, or may generate a noise estimate value based on the sampler output.


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