The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 05, 2025

Filed:

Aug. 03, 2023
Applicant:

Rohde & Schwarz Gmbh & Co. KG, Munich, DE;

Inventor:

Hendrik Bartko, Unterhaching, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 29/10 (2006.01); G01R 29/08 (2006.01);
U.S. Cl.
CPC ...
G01R 29/105 (2013.01); G01R 29/0878 (2013.01);
Abstract

A system for testing a device under test, DUT, comprises a holder configured to hold the DUT, wherein the DUT comprises at least one reconfigurable intelligent surface, RIS. A first antenna array generates plane waves at a position of the at least one RIS when the DUT is arranged on the holder. The first antenna array can generate plane waves having different angles of incidence at the position of the at least one RIS. A second antenna array receives a reflection signal originating from a reflection of a plane wave, wherein the plane wave is generated by the first antenna array and is reflected from the at least one RIS. A determination unit determines an angle of incidence on the second antenna array, using the received reflection signal.


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