The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 05, 2025

Filed:

Sep. 23, 2021
Applicant:

Kabushiki Kaisha Nihon Micronics, Tokyo, JP;

Inventors:

Michitaka Okuta, Tokyo, JP;

Toshinaga Takeya, Aomori, JP;

Hisao Narita, Aomori, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 1/073 (2006.01); G01N 21/95 (2006.01); G01R 1/07 (2006.01); G01R 31/26 (2020.01);
U.S. Cl.
CPC ...
G01R 1/073 (2013.01); G01N 21/9501 (2013.01); G01R 1/071 (2013.01); G01R 31/2635 (2013.01);
Abstract

A measurement system includes a drive device configured to drive the plurality of optical semiconductor elements, a probe unit including a plurality of optical connection devices configured to receive respective emitted lights from the plurality of optical semiconductor elements and a processing device including a plurality of photoelectric converters. Each of the optical connection devices is connected to each of the photoelectric converter, and at least some of the emitted lights received by the optical connection devices are input to the photoelectric converter. The photoelectric converter converts the input emitted lights into electric signals.


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