The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 05, 2025
Filed:
Oct. 31, 2023
Applicant:
Abbott Diabetes Care Inc., Alameda, CA (US);
Inventors:
Lei He, Moraga, CA (US);
Michael R. Love, Pleasanton, CA (US);
Assignee:
ABBOTT DIABETES CARE INC., Alameda, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/66 (2006.01); G01N 27/02 (2006.01); G01R 23/02 (2006.01); H01Q 1/22 (2006.01); H01Q 7/00 (2006.01);
U.S. Cl.
CPC ...
G01N 27/028 (2013.01); G01R 23/02 (2013.01); H01Q 1/2208 (2013.01); H01Q 7/00 (2013.01);
Abstract
Embodiments that translate a sensor measurement to a frequency characteristic are disclosed. The frequency characteristic can be wirelessly detected by a reader device. The detected frequency characteristic can be used to determine the corresponding sensor measurement. Devices utilizing this approach can be characterized or calibrated to increase accuracy. Systems and methods utilizing the approaches are also described.
He, Lei. (2025). Systems, devices, and methods for rf detection of analyte sensor measurements (U.S. Patent No. 12379340). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12379340
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile