The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 05, 2025
Filed:
Mar. 11, 2020
Omron Corporation, Kyoto, JP;
Shingo Hayashi, Kyoto, JP;
Daisuke Konishi, Kyoto, JP;
OMRON CORPORATION, Kyoto, JP;
Abstract
An object is to shorten time required for visual inspection. A visual inspection device () configured to inspect an appearance of an inspection object (), the visual inspection device () including: an imager () configured to image the inspection object () arranged at a predetermined position of the visual inspection device (); and a height measurer () configured to measure a height of the inspection object () carried into the visual inspection device () or carried out from the visual inspection device ().
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile