The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 05, 2025
Filed:
Sep. 30, 2020
The Regents of the University of Colorado, Denver, CO (US);
Sorbonne Université, Paris, FR;
Rafael Piestun, Boulder, CO (US);
Kristina Irsch, Paris, FR;
Simon Labouesse, Boulder, CO (US);
Sylvain Gigan, Paris, FR;
The Regents of the University of Colorado, Denver, CO (US);
Sorbonne Université, Paris, FR;
Abstract
Systems and methods are provided for imaging and characterizing objects including the eye using non-uniform or speckle illumination patterns. According to the present technology, a method for characterizing at least a portion of an object may include generating, using at least one light source, one or multiple non-uniform illumination patterns on an object. The method may also include detecting, using a detector, backscattered light from the object in response to the generating. The method may further include extracting, using the detector, data representative of the backscattered light. The method may also include processing, using a processing unit, the data representative of the backscattered light to create one or more images of at least a portion of the object.