The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 05, 2025
Filed:
Dec. 09, 2021
Sony Group Corporation, Tokyo, JP;
Takeshi Hatakeyama, Chiba, JP;
Satoshi Nagae, Tokyo, JP;
Masanobu Nonaka, Kanagawa, JP;
Kenji Ishida, Tokyo, JP;
Naomichi Kikuchi, Kanagawa, JP;
Takashi Kato, Tokyo, JP;
Sony Group Corporation, Tokyo, JP;
Abstract
A particle analyzer () includes: a light source that emits excitation light (EL) including light having a wavelength of 400 nm or less; a lens structure () that collects excitation light (EL) at a predetermined position () in a flow path (); a detection unit () that detects light (FL) emitted from a particle as the particle () flowing through the predetermined position is excited by the excitation light (EL); and a processing unit () that processes detection data acquired by the detection unit (). The lens structure () includes a plurality of lenses () arranged along an optical axis of the excitation light (EL); and a lens frame () holding the plurality of lenses (). At least one (G) of the plurality of lenses () is positioned in the lens frame () by abutting on a lens adjacent to the lens.