The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 05, 2025
Filed:
Feb. 25, 2022
Applicant:
Hirata Corporation, Kumamoto, JP;
Inventor:
Seigo Murakami, Kumamoto, JP;
Assignee:
HIRATA CORPORATION, Kumamoto, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 1/00 (2006.01); G01N 1/31 (2006.01); G01N 35/00 (2006.01); G01N 35/10 (2006.01);
U.S. Cl.
CPC ...
G01N 1/312 (2013.01); G01N 35/00029 (2013.01); G01N 35/10 (2013.01); G01N 2035/00168 (2013.01); G01N 2035/1027 (2013.01);
Abstract
A sample producing apparatus produces an observation sample by placing an observation target object on a surface of a liquid pool on an optically transparent plate and then removing the liquid pool. The sample producing apparatus comprises a holding means for holding the plate, and a tilting means for tilting the plate such that the liquid pool on the plate is flowed. According to the sample producing apparatus, the working efficiency when producing the observation sample is improved.