The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 05, 2025
Filed:
Jul. 24, 2023
Method for in-situ non-contact detection of symmetry error of keyway located on shaft-type workpiece
Jiangsu University of Science and Technology, Zhenjiang, CN;
Honggen Zhou, Zhenjiang, CN;
Guochao Li, Zhenjiang, CN;
Li Sun, Zhenjiang, CN;
Ying Tang, Zhenjiang, CN;
Baojiang Dong, Zhenjiang, CN;
Xiaoyan Guan, Zhenjiang, CN;
Xiaona Shi, Zhenjiang, CN;
Hengheng Wu, Zhenjiang, CN;
Qiulin Hou, Zhenjiang, CN;
JIANGSU UNIVERSITY OF SCIENCE AND TECHNOLOGY, Zhenjiang, CN;
Abstract
A method for in-situ non-contact detection of a symmetry error of a keyway located on the shaft-type workpiece includes the following steps: establishing a detection system and a system calculation coordinate system; controlling rotation of a shaft-type workpiece, continuously acquiring data of a detection part by means of a laser displacement sensor, and calculating and analyzing the acquired data to obtain a symmetry error of a detection section; and moving the laser displacement sensor in an axis direction, and calculating symmetry errors of a plurality of sections of the keyway, to obtain a symmetry error of the keyway located on the shaft-type workpiece.