The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 05, 2025

Filed:

May. 29, 2024
Applicant:

Pactiv Llc, Lake Forest, IL (US);

Inventor:

Brian M. Murphy, Chicago, IL (US);

Assignee:

PACTIV LLC, Lake Forest, IL (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B65D 55/02 (2006.01); B65D 43/02 (2006.01); B65D 43/16 (2006.01);
U.S. Cl.
CPC ...
B65D 55/024 (2013.01); B65D 43/0237 (2013.01); B65D 43/162 (2013.01); B65D 2543/00194 (2013.01); B65D 2543/00296 (2013.01);
Abstract

Tamper-evident plastic container comprises a base portion having a sidewall and a base flange extending outwardly from at least a portion of the sidewall, and a lid portion having a lid tab joined to the base flange by a hinge, wherein the lid portion has an open position and a closed position. The lid portion is configured to lockingly engage the base portion in the closed position. One of the base flange or the lid tab has a non-linear path of weakness formed therein to define a frangible connection, wherein the frangible connection is configured to be ruptured to initially open the lid portion from the closed position. The non-linear path of weakness is spaced from the hinge to define a tamper indicator region between the non-linear path of weakness and the hinge, wherein the tamper indicator region remains joined to the hinge after the frangible connection is ruptured.


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