The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 05, 2025
Filed:
Apr. 13, 2021
Scantinel Photonics Gmbh, Ulm, DE;
Vladimir Davydenko, Bad Herrenalb, DE;
Scantinel Photonics GmbH, Ulm, DE;
Abstract
A device for scanning measurement of the distance to an object comprises a light source that produces optical signals each having a varying frequency. An optical distribution matrix comprising optical switches and/or optical splitters distributes the optical signals simultaneously or successively onto optical output waveguides. A deflection optical unit deflects the optical signals when exiting from the optical output waveguides so that they are emitted in different directions from the device. A plurality of detectors detect a superposition of one of the optical signals produced by the light source with an optical signal which was reflected from the object. Input waveguides, which are independent of the output waveguides, guide the optical signals reflected from the object to the detectors while bypassing the optical distribution matrix. An evaluation unit determines a distance to the object from the superposition detected by the detectors.