The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 05, 2025

Filed:

Feb. 01, 2021
Applicant:

Fanuc Corporation, Yamanashi, JP;

Inventor:

Reo Osada, Yamanashi, JP;

Assignee:

FANUC CORPORATION, Yamanashi, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B23Q 15/12 (2006.01); G05B 19/418 (2006.01);
U.S. Cl.
CPC ...
B23Q 15/12 (2013.01); G05B 19/4189 (2013.01); G05B 2219/35191 (2013.01);
Abstract

A workpiece machining device includes a sensor unit that detects the passage of a moving workpiece W, a machining unit that performs machining using a predetermined machining tool in a state where the workpiece W is moved, and a machining control unit that controls the operation of the machining unit. The machining control unit issues an operation command signal Sto the machining unit at intervals of a predetermined control cycle T, measures a detection time Ttaken to receive a detection signal Srelative to a cycle start time point of the control cycle T, stores various parameters including the detection time T, a difference between the control cycle T and the detection time Tis defined as a response delay time, and modifies the operation command signal Sin each control cycle T on the basis of the response delay time T.


Find Patent Forward Citations

Osada, Reo. (2025). Workpiece machining device and machining control method (U.S. Patent No. 12377506). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12377506

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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