The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 05, 2025

Filed:

Feb. 05, 2021
Applicant:

New York Society for the Relief of the Ruptured and Crippled, Maintaining the Hospital for Special Surgery, New York, NY (US);

Inventors:

Shady Elmasry, New York, NY (US);

Carl Imhauser, New York, NY (US);

Peter Sculco, New York, NY (US);

Geoffrey Westrich, New York, NY (US);

Cynthia Kahlenberg, New York, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/00 (2006.01); A61F 2/46 (2006.01); A61B 90/00 (2016.01);
U.S. Cl.
CPC ...
A61F 2/468 (2013.01); A61B 2090/3916 (2016.02); A61F 2002/4633 (2013.01); A61F 2002/4666 (2013.01); A61F 2002/4667 (2013.01); A61F 2002/4668 (2013.01);
Abstract

Measured forces applied by a medical professional during a gap assessment can be measured. A plurality of force sensors is placed at a lateral ankle position, a medial ankle position, a lateral foot position, and/or a medial foot position, and each detects an applied force during an abduction-adduction examination. Further, a computing device receives, from each of the plurality of sensors during the abduction-adduction examination, data representing an applied force occurring during the abduction-adduction examination at respective ones of the lateral ankle position, the medial ankle position, the lateral foot position, and the medial foot position. The computing device calculates, using the received data, respective peak applied forces during the abduction-adduction examination in extension and flexion, and provides information representing a correlation of the respective peak applied forces with other information.


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