The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 05, 2025
Filed:
Aug. 02, 2022
Applicant:
Fujifilm Corporation, Tokyo, JP;
Inventors:
Hisatsugu Horiuchi, Kanagawa, JP;
Koji Taninai, Kanagawa, JP;
Masataka Sugahara, Kanagawa, JP;
Takeyasu Kobayashi, Kanagawa, JP;
Assignee:
FUJIFILM CORPORATION, Tokyo, JP;
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/10 (2006.01); A61B 6/00 (2006.01); A61B 6/40 (2024.01); A61B 6/58 (2024.01); G01T 1/17 (2006.01);
U.S. Cl.
CPC ...
A61B 6/4405 (2013.01); A61B 6/4007 (2013.01); A61B 6/587 (2013.01); G01T 1/17 (2013.01);
Abstract
A radiography system includes: a radiation source that emits radiation; an imaging stand having a detection panel that generates a radiation image by detecting the radiation; a lifting device on which a subject to be examined is placed; a misalignment amount detection device that detects a relative misalignment amount between the imaging stand and the subject to be examined; and a lifting control device that lifts and lowers the lifting device on the basis of the misalignment amount detected by the misalignment amount detection device.