The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 05, 2025

Filed:

Sep. 09, 2022
Applicant:

Tomey Corporation, Nagoya, JP;

Inventor:

Keiichiro Okamoto, Nagoya, JP;

Assignee:

Tomey Corporation, Nagoya, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2022.01); A61B 3/00 (2006.01); A61B 3/10 (2006.01); A61B 3/117 (2006.01); A61B 3/12 (2006.01); A61B 3/103 (2006.01);
U.S. Cl.
CPC ...
A61B 3/102 (2013.01); A61B 3/0058 (2013.01); A61B 3/1005 (2013.01); A61B 3/117 (2013.01); A61B 3/12 (2013.01); A61B 3/103 (2013.01);
Abstract

An ophthalmic device includes a first light source configured to output first light, a second light source configured to output second light, a first interferometer configured to acquire a first tomographic image of a first range based on first interference light, a second interferometer configured to acquire a second tomographic image of a second range based on second interference light, and a controller. The controller may be configured to perform a specific scan on a subject eye that scans the first light and the second light simultaneously in a same plane, wherein the first tomographic image and the second tomographic image are obtained by performing the specific scan, calculate an amount of distortion of the first tomographic image, correct the first tomographic image based on the amount of distortion, and correct the second tomographic image based on the amount of distortion.


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