The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 29, 2025
Filed:
Dec. 21, 2023
Equifax Inc., Atlanta, GA (US);
Todd Duncan Hoover, Suwanee, GA (US);
Brandi Nicole Recker, Atlanta, GA (US);
William Charles Gates, Atlanta, GA (US);
Sean Patrick Mckeown, Atlanta, GA (US);
Matthew Richard Jackson, Cumming, GA (US);
Dinesh Hiro Wadhwani, Alpharetta, GA (US);
Equifax Inc., Atlanta, GA (US);
Abstract
A durability assessment system may receive a request, from a computing system, for a durability index describing an entity. The durability assessment system may determine the durability index based on information about the resource usage by the entity, such as a resource availability score or a resource allocation score. The durability assessment system may compare the obtained resource availability score and resource allocation score to ranges associated with a set of durability indices. Based on the comparison, the durability assessment system may determine a durability index for the entity. The durability index may indicate an ability of the entity to return accessed resources. In some cases, the durability assessment system may provide the durability index to an allocation computing system that is configured to determine whether to grant access to resources based on the durability index.