The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 29, 2025
Filed:
Jan. 24, 2023
Apple Inc., Cupertino, CA (US);
Fucheng Wang, Cupertino, CA (US);
Fahmi L Al Sabie, El Cajon, CA (US);
Vikas O Jain, Newark, CA (US);
In Kwang Kim, San Diego, CA (US);
Abhiram Rudrapatna Sridhar, San Jose, CA (US);
Krishna Kalyanaraman, San Jose, CA (US);
Ashwin Mohan, San Diego, CA (US);
Anatoliy S Ioffe, Sunnyvale, CA (US);
Apple Inc., Cupertino, CA (US);
Abstract
A testing device determines an Effective Isotropic Radiated Power (EIRP) of a wanted signal at a beam-peak direction and a maximum Total Radiated Power (TRP) of the wanted signal. The testing device then determines a power difference (ΔP) between the EIRP of the wanted signal at the beam-peak direction and the maximum TRP of the wanted signal. The testing device determines EIRP of a spectral emission mask (SEM) at each measurement bandwidth step at the beam-peak direction. The testing device then determines TRP at each measurement bandwidth step by determining a difference between the EIRP of the SEM at that measurement bandwidth step and the power difference (ΔP). The testing device compares the TRP at each measurement bandwidth step to a SEM specification, and reports whether the SEM specification has been met.