The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 29, 2025

Filed:

Feb. 24, 2023
Applicant:

Calterah Semiconductor Technology (Shanghai) Co., Ltd, Shanghai, CN;

Inventors:

Zhefan Chen, Shanghai, CN;

Dian Wang, Shanghai, CN;

Shan Li, Shanghai, CN;

Kaijie Zhuang, Shanghai, CN;

Xuejuan Huang, Shanghai, CN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01P 1/22 (2006.01); G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
H01P 1/222 (2013.01); G01R 31/2851 (2013.01);
Abstract

An attenuation apparatus and a test system. The attenuation apparatus includes a signal transmission channel and at least one radiation loss structure, wherein the signal transmission channel is configured to perform transmission attenuation on the energy of a transmitted signal; the radiation loss structure is arranged in the signal transmission channel; the radiation loss structure has a first operating state and a second operating state; when the radiation loss structure is in the first operating state, the radiation loss structure is configured to perform radiation attenuation on the energy of a signal transmitted by the signal transmission channel; and when the radiation loss structure is in the second operating state, the radiation loss structure is configured to perform transmission attenuation on the energy of the signal transmitted by the signal transmission channel.


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