The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 29, 2025

Filed:

Dec. 06, 2023
Applicant:

Western Digital Technologies, Inc., San Jose, CA (US);

Inventors:

Iouri Oboukhov, Rochester, MN (US);

Richard Galbraith, Rochester, MN (US);

Jonas Goode, Lake Forest, CA (US);

Niranjay Ravindran, Rochester, MN (US);

Jihoon Park, San Jose, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11B 19/04 (2006.01); G11B 19/12 (2006.01); G11B 20/18 (2006.01);
U.S. Cl.
CPC ...
G11B 19/048 (2013.01); G11B 19/041 (2013.01); G11B 19/128 (2013.01); G11B 20/1813 (2013.01); G11B 20/182 (2013.01); G11B 20/1833 (2013.01); G11B 2020/185 (2013.01);
Abstract

Example systems, data storage devices, testers, and methods for storage device configuration using mutual information are described. A data storage device may include channel circuit configuration settings for the encoding and decoding of data written to a non-volatile storage medium. Mutual information metrics may be calculated based on a multi-bit symbol size to compensate for inter-symbol interference and compared to mutual information thresholds to determine the configuration settings, such as bit and track densities, error correction codes, and modulation codes. Mutual information metrics may be used to characterize heads and media independent of the configuration settings.


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