The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 29, 2025

Filed:

Aug. 25, 2020
Applicant:

Nec Corporation, Tokyo, JP;

Inventors:

Royston Rodrigues, Tokyo, JP;

Masahiro Tani, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06V 10/74 (2022.01); G06V 10/44 (2022.01); G06V 10/771 (2022.01); G06V 10/82 (2022.01); G06V 20/17 (2022.01);
U.S. Cl.
CPC ...
G06V 10/761 (2022.01); G06V 10/44 (2022.01); G06V 10/771 (2022.01); G06V 10/82 (2022.01); G06V 20/17 (2022.01);
Abstract

The image matching apparatus () comprises a ground-view feature extractor (), an aerial-view feature extractor (), and a determination unit (). The ground-view feature extractor () extracts features from the ground-view image () to generate feature maps without attention mechanism and feature maps with attention mechanism. The aerial-view feature extractor () extracts features from the aerial-view image () to generate feature maps without attention mechanism and feature maps with attention mechanism. The determination unit () computes a similarity score, which indicates a degree of similarity between the ground-view image () and the aerial-view image (), based on the generated feature maps. Then, the determination unit () determines whether the ground-view image () matches the aerial-view image () based on the similarity score.


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