The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 29, 2025

Filed:

Dec. 22, 2022
Applicant:

Apple Inc., Cupertino, CA (US);

Inventors:

Luke A Pillans, San Diego, CA (US);

Aleksandr M Movshovich, Santa Clara, CA (US);

Nicholas C Soldner, Mountain View, CA (US);

Daniel Kurz, Boulder, CO (US);

Arthur Y Zhang, Mountain View, CA (US);

Assignee:

Apple Inc., Cupertino, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/514 (2017.01); G01N 21/00 (2006.01); G02B 27/01 (2006.01); G06T 17/00 (2006.01); G06V 10/141 (2022.01); G06V 10/60 (2022.01); G06V 10/762 (2022.01); H04N 5/74 (2006.01); H04N 23/21 (2023.01);
U.S. Cl.
CPC ...
G06T 7/514 (2017.01); G02B 27/0172 (2013.01); G06T 17/00 (2013.01); G06V 10/141 (2022.01); G06V 10/60 (2022.01); G06V 10/762 (2022.01); H04N 5/74 (2013.01); H04N 23/21 (2023.01); G01N 21/00 (2013.01);
Abstract

Methods and apparatus for specular surface mapping in which a camera detects reflections of a light source from a specular surface. The detected light sources may be projected onto a celestial sphere as virtual point sources. True positive observations should be tightly clustered on the celestial sphere; thus, false positives may be identified and removed. Specular surface information may then be determined from clusters of the virtual point sources on the celestial sphere. The clusters of virtual point sources on the celestial sphere may be identified and used to identify a surface as a specular surface. The clusters may also be used to extract other information regarding the specular surface, including but not limited to distance to and extent of the specular surface.


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