The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 29, 2025
Filed:
Sep. 26, 2022
Okuma Corporation, Aichi, JP;
Shigemoto Hirota, Aichi, JP;
Akihito Kataoka, Aichi, JP;
Keigo Asano, Aichi, JP;
Masahiro Maeda, Aichi, JP;
OKUMA CORPORATION, Aichi, JP;
Abstract
A three-dimensional shape measurement system includes an image pickup unit, a storage device that stores image pickup conditions required in imaging for measurement as condition information for each of a plurality of combinations of the material and surface property of an object, and a measurement controller that controls driving of the image pickup unit. The measurement controller identifies the material and surface property of the object, specifies image pickup conditions corresponding to the identified material and surface property of the object based on the condition information, causes the image pickup unit to perform the imaging for measurement under the specified image pickup conditions, and measures the shape of the object based on the obtained image for measurement.