The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 29, 2025

Filed:

Jun. 17, 2022
Applicant:

Wisconsin Alumni Research Foundation, Madison, WI (US);

Inventors:

Varun Sundar, Madison, WI (US);

Mohit Gupta, Madison, WI (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/50 (2017.01);
U.S. Cl.
CPC ...
G06T 7/50 (2017.01); G06T 2207/10028 (2013.01); G06T 2207/30204 (2013.01);
Abstract

In accordance with some embodiments, systems, methods, and media for estimating depths in a scene using single-photon detectors and binary structured light patterns are provided. In some embodiments, a system comprises: a light source; an image sensor comprising an array including single-photon detectors; a processor programmed to: cause the light source to emit a sequence of n binary light patterns toward the scene, each comprising at least L columns, each of the patterns has a minimum stripe width of 8 columns; and n>log(L); cause, for each of the n binary light patterns, the image sensor to capture a binary image of the scene, the binary image comprises a binary value for each of single-photon detectors such that each of the single-photon detectors generates a set of binary values; and estimate, for each single-photon detector, a depth value based on the set of binary values.


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