The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 29, 2025

Filed:

Mar. 03, 2021
Applicant:

National University Corporation Kumamoto University, Kumamoto, JP;

Inventor:

Tetsuya Yoneda, Kumamoto, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); A61B 5/00 (2006.01); A61B 5/055 (2006.01); G01R 33/56 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0012 (2013.01); A61B 5/0042 (2013.01); A61B 5/055 (2013.01); A61B 5/4088 (2013.01); A61B 5/4842 (2013.01); G01R 33/5608 (2013.01); G06T 2207/10088 (2013.01); G06T 2207/30016 (2013.01); G06T 2207/30096 (2013.01); G06T 2207/30168 (2013.01);
Abstract

An image processing apparatus processes magnetic resonance image data acquired by scanning multiple regions of a living body. An MRI imaging apparatus scans multiple regions of the living body to acquire the magnetic resonance image data. An image processing unit generates phase difference image data from the magnetic resonance image data. A signal acquisition unit acquires a phase difference image signal from the phase difference image data. A statistic calculation unit performs statistical processing of the distribution of the phase difference image signal with respect to the phase difference for each region to calculate a statistic, for example. A target material evaluation unit evaluates the amount of the target material included in multiple regions using the statistic for each region.


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