The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 29, 2025
Filed:
Mar. 27, 2025
Hefei General Machinery Research Institute Co., Ltd., Anhui, CN;
Special Equipment Inspection Station of Hefei General Machinery Research Institute Co., Ltd., Anhui, CN;
Abstract
Creep stage determination system and method for aluminum-containing heat-resistant alloy furnace tube, the system includes: a micro-imaging unit, a display unit, a memory, and a processor, the micro-imaging unit configured to image specimen, the display unit configured to display a microstructure photograph of the specimen, the micro-imaging unit, the display unit, the memory and the processor are communicatively connected, and the processor is configured to: acquire at least one field-of-view image; for the field-of-view image, carry out image recognition on the field-of-view image to determine an eigenvalue of the field-of-view image; based on the eigenvalue of the at least one field-of-view image, determine a target creep value by a generative model; determine, based on the target creep value, the creep stage; and send the at least one field-of-view image and the creep stage to the display unit to display the at least one field-of-view image and the creep stage.