The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 29, 2025

Filed:

Jan. 17, 2022
Applicant:

Shenyang Institute of Automation, Chinese Academy of Sciences, Liaoning, CN;

Inventors:

Jiandong Tian, Liaoning, CN;

Shijun Zhou, Liaoning, CN;

Zhen Zhang, Liaoning, CN;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 5/70 (2024.01); G06T 7/507 (2017.01); G06T 7/70 (2017.01); G06T 7/80 (2017.01); G06V 10/75 (2022.01);
U.S. Cl.
CPC ...
G06T 5/70 (2024.01); G06T 7/507 (2017.01); G06T 7/70 (2017.01); G06T 7/80 (2017.01); G06V 10/751 (2022.01); G06T 2207/10152 (2013.01);
Abstract

A new image formation model for descattering different from the previous works based on atmospheric scattering model is established. It can provide a corresponding physical explanation for each scattering environment, illustrate a relationship between a light source position and scattering conditions and solve the problem of scattering removal under non-uniform illumination. Firstly, a dark angle of a camera is removed by an integrating sphere; then, a pure scattering part is found by an improved dark channel-like prior method; and finally, a zenith angle, an azimuth angle, an extinction coefficient and other related physical quantities are calculated according to the light attenuation and backscattering distribution of a scattering medium to eliminate the backscattering and light attenuation. Theoretically, the model can be used in any uniform scattering medium, such as underwater and fog environments, and works well in high-density media.


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