The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 29, 2025
Filed:
Jun. 30, 2021
Telefonaktiebolaget Lm Ericsson (Publ), Stockholm, SE;
Razieh Abbasi Ghalehtaki, Québec, CA;
Fetahi Wuhib, Québec, CA;
Amin Ebrahimzadeh, Québec, CA;
Roch Glitho, Québec, CA;
TELEFONAKTIEBOLAGET LM ERICSSON (PUBL), Stockholm, SE;
Abstract
Embodiments described herein relate to a method and apparatus for detecting and explaining anomalies in data obtained from an environment using an encoder-decoder machine learning model. A state of the environment is represented by a plurality of features, and the machine learning model is trained with a first set of data samples. Each data sample in the first set of data samples comprises values for each of the plurality of features. The method comprises determining a respective first threshold for each of the plurality of features based on respective maximum reconstruction errors for each feature found during training of the encoder-decoder machine learning model; obtaining an anomalous data sample; determining respective reconstruction errors for each feature in the anomalous data sample using the trained encoder-decoder machine learning model; and determining one or more features in the anomalous data sample that are responsible for the anomalous data sample being anomalous responsive to the reconstruction errors associated with the one or more features being greater than or equal to the respective first thresholds.