The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 29, 2025
Filed:
Apr. 18, 2024
Nec Laboratories America, Inc., Princeton, NJ (US);
Vijay Kumar Baikampady Gopalkrishna, Santa Clara, CA (US);
Samuel Schulter, Long Island City, NY (US);
Manmohan Chandraker, Santa Clara, CA (US);
Xiang Yu, Mountain View, CA (US);
NEC Corporation, Tokyo, JP;
Abstract
Systems and methods are provided for identifying and retrieving semantically similar images from a database. Semantic analysis is performed on an input query utilizing a vision language model to identify semantic concepts associated with the input query. A preliminary set of images is retrieved from the database for semantic concepts identified. Relevant concepts are extracted for images with a tokenizer by comparing images against a predefined label space to identify relevant concepts. A ranked list of relevant concepts is generated based on occurrence frequency within the set. The preliminary set of images is refined based on selecting specific relevant concepts from the ranked list by the user by combining the input query with the specific relevant concepts. Additional semantic analysis is iteratively performed to retrieve additional sets of images semantically similar to the combined input query and selection of the specific relevant concepts until a threshold condition is met.