The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 29, 2025
Filed:
Jul. 17, 2023
Splunk Inc., San Francisco, CA (US);
Houwu Bai, San Jose, CA (US);
Kristal Curtis, San Francisco, CA (US);
William Deaderick, Austin, TX (US);
Tanner Gilligan, San Bruno, CA (US);
Poonam Yadav, San Francisco, CA (US);
Om Rajyaguru, San Diego, CA (US);
Cisco Technology, Inc., San Jose, CA (US);
Abstract
Computerized methodologies are disclosed that are directed to detecting anomalies within a time-series data set. An aspect of the anomaly detection process includes determining one or more seasonality patterns that correspond to a specific time-series data set by evaluating a set of candidate seasonality patterns (e.g., hourly, daily, weekly, day-start off-sets, etc.). The evaluation of a candidate seasonality pattern may include dividing the time-series data set into a collection of subsequences based on the particular candidate seasonality pattern. Further, the collection of subsequences may be divided into clusters and a silhouette score may be computed to measure the clustering quality of the candidate seasonality pattern. In some instances, the candidate seasonality pattern having the highest silhouette score is selected and utilized in anomaly detection process. In other instances, a plurality of seasonality patterns may be combined forming a time policy, where the time policy is utilized in anomaly detection process.