The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 29, 2025

Filed:

Jul. 27, 2023
Applicant:

Sap SE, Walldorf, DE;

Inventors:

Yu Gao, Xi'an, CN;

Junpeng Liu, Xi'an, CN;

Zhifeng Xu, Xi'an, CN;

Hyeong Seog Kim, Seoul, KR;

Won Wook Hong, Seoul, KR;

Ji Hoon Jang, Seoul, KR;

Assignee:

SAP SE, Walldorf, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/00 (2019.01); G06F 16/27 (2019.01);
U.S. Cl.
CPC ...
G06F 16/27 (2019.01);
Abstract

Disclosed techniques and solutions can provide improved snapshot replication. Typically, an initial replica obtained using snapshot replication is periodically updated. However, the update process can unnecessarily consume computing resources if data in a source data object has not changed with respect to data in a replica data object. Disclosed techniques check to determine whether a snapshot replica is out of date before obtaining a new snapshot. The checks can be performed on manual request or on the occurrence of triggers, such as receiving a query that accesses the replica data object or according to a schedule. Information for current and prior versions of the remote data object can be compared to determine whether a replica is out of date, such as digest values of contents of the remote data object or timestamps associated with the remote data object.


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