The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 29, 2025
Filed:
Feb. 02, 2022
Splunk Inc., San Francisco, CA (US);
Zhaohui Wang, San Francisco, CA (US);
Ryan Gannon, San Francisco, CA (US);
Xiao Lin, San Jose, CA (US);
Chandrima Sarkar, Dublin, CA (US);
Cisco Technology, Inc., San Jose, CA (US);
Abstract
A computerized method for detection of format drift and format anomalies is described. A format representation for each data point of a first data sample is extracted. Transformations of each format representation is conducted, resulting in a first plurality of count values (reference) and a second plurality of count values. Each count value identifies a number of occurrences of a transformed format representation within that data sample. Thereafter, a first probability distribution for the first plurality of count values and a second probability distribution for the second plurality of count values are computed. Analytics using the first and probability distributions are conducted to produce a first metric. A format drift is determined based on an evaluation of the first metric to a second metric operating as a threshold metric. Format anomalies are detected based on analytics of hashed format representation and determination of infrequent usage of a particular format representation.