The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 29, 2025

Filed:

May. 01, 2023
Applicant:

Pure Storage, Inc., Mountain View, CA (US);

Inventors:

John D. Davis, San Francisco, CA (US);

John Hayes, Mountain View, CA (US);

Hari Kannan, Sunnyvale, CA (US);

Nenad Miladinovic, Los Gatos, CA (US);

Zhangxi Tan, Mountain View, CA (US);

Assignee:

PURE STORAGE, INC., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/10 (2006.01); G06F 11/07 (2006.01); G06F 16/182 (2019.01); G11C 16/34 (2006.01); G11C 29/44 (2006.01); G11C 29/52 (2006.01); G06F 12/02 (2006.01); G11C 29/04 (2006.01);
U.S. Cl.
CPC ...
G06F 11/1068 (2013.01); G06F 11/076 (2013.01); G06F 11/1048 (2013.01); G06F 16/182 (2019.01); G11C 16/349 (2013.01); G11C 29/44 (2013.01); G11C 29/52 (2013.01); G06F 12/0246 (2013.01); G06F 16/1827 (2019.01); G06F 2212/7207 (2013.01); G06F 2212/7208 (2013.01); G06F 2212/7211 (2013.01); G11C 2029/0409 (2013.01); G11C 2029/0411 (2013.01);
Abstract

In some embodiments, a method for die-level monitoring is provided. The method includes distributing user data throughout a plurality of storage nodes through erasure coding, wherein the plurality of storage nodes are housed within a chassis that couples the storage nodes. Each of the storage nodes has a non-volatile solid-state storage with non-volatile memory and the user data is accessible via the erasure coding from a remainder of the storage nodes in event of two of the storage nodes being unreachable. The method includes producing diagnostic information that diagnoses the non-volatile memory on a basis of per package, per die, per plane, per block, or per page, the producing performed by each of the plurality of storage nodes. The method includes writing the diagnostic information to a memory in the storage cluster.


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