The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 29, 2025

Filed:

Jul. 15, 2020
Applicant:

Arizona Board of Regents on Behalf of the University of Arizona, Tucson, AZ (US);

Inventors:

Thomas D. Milster, Tucson, AZ (US);

Akira Eguchi, Tucson, AZ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03H 1/16 (2006.01); G01B 9/021 (2006.01); G01M 11/02 (2006.01); G03H 1/22 (2006.01);
U.S. Cl.
CPC ...
G03H 1/16 (2013.01); G01B 9/021 (2013.01); G01M 11/0242 (2013.01); G03H 1/2294 (2013.01); G02F 2203/18 (2013.01);
Abstract

A new diversity concept is provided for achieving accurate phase retrieval with a single shot acquisition. Multiple irradiance data are obtained by a diffractive grating or CGH designed to generate multiple diffraction orders with different diversity values. The effective filters associated with the individual diffraction orders from the diffractive grating or CGH are calculated. The effective filters are extracted by numerical propagation, and they preferably include both real and imaginary values, which signify both absorption and phase shift versus position in the filter plane. The reconstruction process utilizes accurate knowledge of the effective filters for each diffraction order for high quality reconstruction of the extrinsic phase.


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