The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 29, 2025

Filed:

Nov. 14, 2023
Applicant:

10x Genomics, Inc., Pleasanton, CA (US);

Inventors:

Adam Joseph Monkowski, Pleasanton, CA (US);

Elijah Roberts, Pleasanton, CA (US);

Benjamin Pruitt, Cambridge, MA (US);

Assignee:

10x Genomics, Inc., Pleasanton, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/36 (2006.01); G02B 21/16 (2006.01); G02B 21/26 (2006.01); H04N 23/55 (2023.01); H04N 23/68 (2023.01); A61B 90/20 (2016.01);
U.S. Cl.
CPC ...
G02B 21/367 (2013.01); G02B 21/16 (2013.01); G02B 21/26 (2013.01); G02B 21/361 (2013.01); H04N 23/55 (2023.01); H04N 23/6812 (2023.01); H04N 23/683 (2023.01); A61B 90/20 (2016.02);
Abstract

Various embodiments of the present disclosure disclose methods and systems for actively monitoring an opto-fluidic instrument for vibrational disturbances and correcting images obtained during the detected disturbances. In various embodiments, an optical imaging system may acquire Z-stack images of samples supported by an XY-stage. Vibrations can cause individual stacks to be sheared, i.e., to not be co-located with respect to neighboring Z-stacks. In various embodiments, an offset between the measured positions and the expected positions of the sheared stacks may be computed, and a determination as to whether to correct or reacquire the Z-stack images may be made based at least in part on the computed offset.


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