The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 29, 2025
Filed:
Feb. 16, 2023
Safran Electronics & Defense, Paris, FR;
Loïc Davain, Moissy-Cramayel, FR;
Clément Misandeau, Moissy-Cramayel, FR;
SAFRAN ELECTRONICS & DEFENSE, Paris, FR;
Abstract
A method for statistically correcting the estimation of the state X of a system, the state X including a physical quantity, correcting the estimation of this state X being carried out on the basis of a plurality of observations Yrelating to this state X, each observation being obtained by a different measurement relating to at least one physical quantity, the method being implemented by a device including a calculator, the method including determining for each observation Y, the difference between the observation Yand the estimated state referred to as innovation Z, using the relationship Z=Y−HX where H is the observation matrix associated with the statistical filter considered; associating an ordering parameter with each observation Y, the ordering parameter being given by the relationship Ord=|Z−Z| where Zis a predetermined reference value; classifying the measurements in ascending order of the ordering parameter associated therewith; and correcting errors on the estimations using the statistical filter.