The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 29, 2025
Filed:
Sep. 12, 2022
Canon Kabushiki Kaisha, Tokyo, JP;
Hirotaka Seki, Tokyo, JP;
CANON KABUSHIKI KAISHA, Tokyo, JP;
Abstract
An inspection system comprises a plurality of image capturing systems including a first image capturing unit, a first irradiation unit corresponding to the first image capturing unit, a second irradiation unit that does not correspond to the first image capturing unit but corresponds to a second image capturing unit and in which the irradiated terahertz waves are directly incident to the first image capturing unit, and a control unit that controls the plurality of image capturing systems such that the timing of a period of image capturing of the first image capturing unit and the timing of a period of irradiation of the terahertz waves of the second irradiation unit is different.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile