The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 29, 2025

Filed:

Aug. 25, 2023
Applicant:

Keysight Technologies, Inc., Santa Rosa, CA (US);

Inventor:

Rishi Mohindra, Santa Clara, CA (US);

Assignee:

KEYSIGHT TECHNOLOGIES, INC., Santa Rosa, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 23/20 (2006.01); G01R 29/06 (2006.01);
U.S. Cl.
CPC ...
G01R 23/20 (2013.01); G01R 29/06 (2013.01);
Abstract

Measuring MDEVM of a DUT includes splitting an RF signal output by a DUT into first and second RF signals; acquiring and digitizing the first and second RF signals in first and second channels without demodulating the first and second RF signals; performing equalization of the first and second RF signals; measuring first and second modulation distortion (MD) error vectors of the equalized first and second RF signals; performing cross-correlation of the first and second MD error vectors across the first and second channels; averaging the cross-correlated MD error vectors over symbols and packets of the RF signal; and dividing the averaged cross-correlated MD error vectors by signal power of an ideal signal to obtain cross-correlated MDEVMs over a time period or bandwidth of a waveform of the RF signal, where performing the cross-correlation suppresses contribution of uncorrelated noise.


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