The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 29, 2025
Filed:
Oct. 27, 2021
Beckman Coulter, Inc., Brea, CA (US);
Wido Menhardt, Los Galtos, CA (US);
Thomas W. Roscoe, Prior Lake, MN (US);
Takayuki Mizutani, Edina, MN (US);
Beckman Coulter, Inc., Brea, CA (US);
Abstract
Quality control tests for a diagnostic instrument can be run in an efficient manner by using a subset of the potential quality control materials to perform tests for identifying failures in the diagnostic instrument's components. Such subsets could be defined in a variety of manners, and could allow component failures to be tested relatively more frequently in a more efficient manner. Additionally, issues for particular components of diagnostic instruments may be identified based on analysis of quality control results. This identification may be part of a method that comprises receiving a plurality of quality control results wherein each quality control result from the plurality of quality control results is obtained based on performing a measurement of a corresponding quality control sample using the diagnostic instrument.