The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 29, 2025
Filed:
Jun. 25, 2021
Applicant:
Beckman Coulter, Inc., Brea, CA (US);
Inventors:
Takayuki Mizutani, Edina, MN (US);
Kiyotaka Kubota, Akishima, JP;
Carl Erickson, Waconia, MN (US);
Scott Maik, Brooklyn Center, MN (US);
Nicole Sovde, Eden Prairie, MN (US);
Assignee:
Beckman Coulter, Inc., Brea, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 35/00 (2006.01); G01N 21/76 (2006.01); G01N 35/10 (2006.01);
U.S. Cl.
CPC ...
G01N 35/00623 (2013.01); G01N 35/00712 (2013.01); G01N 35/1016 (2013.01); G01N 21/76 (2013.01); G01N 2035/00653 (2013.01); G01N 2035/1025 (2013.01);
Abstract
A method for operating and diagnosing faults in a laboratory instrument comprising a plurality of subsystems may comprise performing an analytic sequence and a set of diagnostic steps. Such a method may be performed using a diagnostic reagent comprising paramagnetic particles and lacking an antibody component. Such a method may also include evaluating a set of the instrument's subsystems in the opposite of the order in which those subsystems are used during analysis.