The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 29, 2025

Filed:

Jun. 01, 2022
Applicant:

The State of Israel, Ministry of Agriculture & Rural Development, Agricultural Research Organization (Aro) (Volcani Center), Rishon Lezion, IL;

Inventors:

Uri Yermiyahu, Yavne, IL;

Zeev Schmilovitch, Yehud, IL;

Victor Alchanatis, Mazkeret Batya, IL;

Tal Rapaport, Lehavim, IL;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/223 (2006.01); G01N 21/3563 (2014.01); G01N 21/68 (2006.01); G01N 21/84 (2006.01); G01N 33/00 (2006.01);
U.S. Cl.
CPC ...
G01N 23/223 (2013.01); G01N 21/3563 (2013.01); G01N 21/68 (2013.01); G01N 21/84 (2013.01); G01N 33/0098 (2013.01); G01N 2021/8466 (2013.01); G01N 2223/076 (2013.01);
Abstract

A method of measuring element concentration in plant leaves comprises steps of: (a) gathering leaves of plants to be tested; (b) conditioning specimens of said leaves; (c) obtaining raw count-per-second XRF datasets of said specimens; (d) obtaining raw NIR datasets of said specimens; (e) obtaining raw analytical datasets; and (f) assessing concentrations of minerals within said specimens on the basis of said count-per-second XRF, NIR and analytical datasets. The aforesaid method further comprises steps of obtaining white reference radiance datasets and normalizing said raw NIR datasets on the basis thereof and providing NIR reflectance datasets.


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