The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 29, 2025
Filed:
Sep. 30, 2020
Eyetech Co., Ltd., Tokyo, JP;
Nippon Signal Co., Ltd., Tokyo, JP;
Yosuke Tsuji, Tokyo, JP;
Shinya Saito, Tokyo, JP;
Tatsuro Hayashi, Tokyo, JP;
Eishi Kawasaki, Saitama, JP;
Masaki Takahashi, Saitama, JP;
Kazuaki Takayama, Saitama, JP;
Eyetech Co., Ltd., Tokyo, JP;
Nippon Signal Co., Ltd., Tokyo, JP;
Abstract
Provided are system, method, program, and recording medium for non-destructively inspecting baggage in which an inspection corresponding to an article to be inspected is performed even when the article overlaps various objects including similar materials, whereby the system, method, program, and recording medium are efficient and do not exhibit any oversight in inspection. The system comprising a belt conveyor by which baggage is transported, a radiation unit that irradiates the baggage with X-rays, an imaging unit that captures X-rays passing through the baggage, an analysis unit by which image information from the imaging unit is analyzed, a display unit by which an image analyzed by the analysis unit is displayed, and a controller that performs a control so that at least part of the article to be sensed is displayed as an object by the display unit when at least part of the article is analyzed.