The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 29, 2025

Filed:

Nov. 11, 2022
Applicant:

Honeywell International Inc., Charlotte, NC (US);

Inventor:

Michael Hughes, North Vancouver, CA;

Assignee:

HONEYWELL INTERNATIONAL INC., Charlotte, NC (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/89 (2006.01); G01N 21/93 (2006.01);
U.S. Cl.
CPC ...
G01N 21/8901 (2013.01); G01N 21/93 (2013.01);
Abstract

A compact C-shaped scanner employs at least two sensors and has a mechanism to standardize or calibrate the sensors. The upper and lower elongated beams of the C-frame include a mid-beam sensor and an outer beam sensor. The scanner can monitor the entire width of a continuous sheet by advancing the scanner back and forth along a scanning distance that is only about half that of the sheet width thereby minimizing the required offsheet distance by an amount approaching half the width of the sheet being monitored. Standardization tiles consisting of references materials that are positioned laterally from the edges of the moving sheet allow for calibration of the sensors which operate either in the transmissive or reflective mode. Selected sheet properties or characteristics of the sheet material can be measured. The two sensors can operate in the transmissive or four sensors can operate in the reflective mode.


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