The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 29, 2025
Filed:
Feb. 28, 2020
Carl Zeiss Meditec Ag, Jena, DE;
Rainer Leitgeb, Vienna, AT;
Manfred Dick, Gefell, DE;
Roland Bergner, Jena, DE;
Ralf Ebersbach, Schmölln, DE;
Thomas Pabst, Stadtroda, DE;
Carl Zeiss Meditec AG, Jena, DE;
Abstract
A method of controlling a semiconductor-laser-diode-based SS-interferometer system (SS=swept source), for a wide range of application suitable for use in ophthalmology, for example for imaging and for determining biometric measurement values of the eye. In a method according to the invention, by application of periodic current modulation, the operation of single semiconductor laser diode is designed such that a highly coherent spectral laser line can be adjusted with a highest possible repetition rate over a wide wavelength range. The parameters: center wavelength, sweep rate, sweep range, optical power in the eye and coherence length are adjusted such that the method is suitable for imaging and biometric applications via whole-eye scans. A semiconductor-laser-diode-based SS-interferometer system is provided, for biometric measuring of the eye. Embodiments are based for example on optical, coherence tomographic scan images. Applications lie in ophthalmological diagnostics, treatment and the preparation of surgical procedures and follow-up thereof.