The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 29, 2025

Filed:

Feb. 21, 2023
Applicant:

Jasco Corporation, Tokyo, JP;

Inventors:

Tomohiro Katsumata, Tokyo, JP;

Hiroshi Sugiyama, Tokyo, JP;

Assignee:

JASCO CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/3563 (2014.01); G01N 21/35 (2014.01);
U.S. Cl.
CPC ...
G01N 21/3563 (2013.01); G01N 2021/3595 (2013.01); G01N 2201/06113 (2013.01); G01N 2201/0636 (2013.01); G01N 2201/1211 (2013.01);
Abstract

A Fourier transform infrared spectrometer (FTIR) includes: an infrared light source; an interferometer; a semiconductor laser for position reference of a movable mirror thereof, and a computer that performs Fourier transformation to a detected signal of an infrared interference wave from a sample to calculate a spectrum based on a memorized wavelength of the semiconductor laser and a detected value of a laser interference wave by a laser detector. The computer executes a program for calculating a spectrum of a solid reference sample, interpolating the spectrum of the reference sample in a wavenumber region of a unique peak, reading out a wavenumber of the unique peak based on a data after interpolation, and updating the wavelength of the semiconductor laser used in Fourier transformation such that the read-out value of the wavenumber falls within a specific range having an original wavenumber of the unique peak as a reference.


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