The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 29, 2025
Filed:
Mar. 19, 2020
Applicant:
Microvizual, Inc., New York, NY (US);
Inventors:
Zhengping Zhuang, Bethesda, MD (US);
Anthony Cappadona, Bethesda, MD (US);
Young Wan Moon, Seoul, KR;
Assignee:
Microvizual, Inc., New York, NY (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 1/31 (2006.01); G01N 1/06 (2006.01); G01N 1/30 (2006.01); G01N 1/36 (2006.01); G01N 35/00 (2006.01); H04N 23/60 (2023.01);
U.S. Cl.
CPC ...
G01N 1/312 (2013.01); G01N 1/06 (2013.01); G01N 1/30 (2013.01); G01N 1/36 (2013.01); G01N 35/00009 (2013.01); G01N 2001/317 (2013.01); G01N 2001/362 (2013.01); H04N 23/60 (2023.01);
Abstract
Disclosed is plate or film for collecting and analyzing a sample. The plate or film includes a surface and a plurality of slices from the sample immobilized on the surface. Further, the plurality of slices are cut from the sample with equal thickness, and the plurality of slices are placed on the surface of the plate or film following their cutting order.